19/08/2020 Wafer Metrology Center Co-Label EURIPIDES² & PENTA

Europe’s open, multi-application platform for wafer production with onsite configurability [WMC]
The Wafer Metrology Center (WMC) project will develop an open, modular metrology and inspection tool for wafer handling in a wide range of semiconductor applications, and which can be retooled onsite to deal with rapidly-changing requirements. Importantly, this platform will also establish a European foothold in a key marketplace.

Project Profile